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define_secondary_emission

The algorithm is a simple one suggested by J. Lewellen (APS). We assume that the secondary emission yield is a function only of the incident particle's kinetic energy. Each time a particle is lost, the code determines where the particle intersected the metal boundary. The mean secondary yield is computed from the kinetic energy at the time of loss. The number of secondary particles emitted is chosen using a Poisson distribution with that mean. The secondary particles are placed ``slightly'' ($\Delta r/10^6$ or $\Delta z/10^6$) outside the metal surface.

To prevent runaway, the secondary yield curve should fall to zero for low energies. If you have problems with runaway, try setting the yield_limit parameter to a small positive integer. Runaway appears to be associated (at times) with the occasional production of large numbers of secondaries due to the tails of the Poisson distribution.


next up previous
Next: define_snapshots Up: Manual Pages Previous: define_screen
Robert Soliday 2015-09-02